[ecoop-info] Call for papers: MoDeVVa 2010 @ MODELS

Levi Lucio levi.lucio at di.fct.unl.pt
Wed Jun 9 09:46:48 CEST 2010


                          MoDeVVa 2010
                 Co-located  with  MODELS  2010
          http://www.model-based-testing.de/modevva10/

    7th Workshop on Model Design, Verification and Validation
      ** Integrating Verification and Validation in MDE **

                           Oslo, Norway
                     October 3, 4 or 5, 2010


*** Call for Papers ***

Models are purposeful abstractions of any artifact at an arbitrary
abstraction level. They can serve several purposes and bear several
advantages. For instance, they allow humans to understand complex
systems, to validate requirements expressed as a formal model, or to
generate big parts of system implementations or tests. Obviously, this
can results in reduced system engineering effort. As a consequence,
the usage of models, model transformations, and code generation is
becoming more and more important for industrial applications.
Model-Driven Engineering (MDE) is a development methodology that is
based on models, meta-models, and model transformations - it is one of
the most important representatives for the application of models.
Currently there is growing tool support for models, (domain-specific)
graphical or textual modeling languages, model transformations, and
code generation. The constant pace at which scientific and industrial
development of MDE-related techniques moves forward shows that MDE is
still quickly changing and that new approaches and corresponding
issues arise frequently. Most important, there is crucial need for
validation and verification (V&V) techniques in the context of MDE.
The other way round, MDE is used to support many V&V activities like,
e.g., model-based testing.

*** Topics of MoDeVVa ***
The workshop on model-driven engineering, verification, and validation
(MoDeVVa) in 2010 has the objective to offer a forum for researchers
and practitioners who are working on V&V and MDE. The main goals of
the workshop are to identify, discuss, and elaborate mutual impacts of
MDE and V&V.

The major questions about MDE and V&V concern possible overlappings
and mutual benefits for both techniques: How can MDE improve V&V and
how can V&V leverage the techniques around MDE? Does a model,
meta-model, or model transformation express what the user wanted to
express? Are these artifacts correct with respect to security, time,
and other constraints? How to model such non-functional aspects? How
can product-related artifacts like product lines be modeled and
tested? How can models or modeling languages (meta-models) support
V&V, e.g. in model-based testing? What modeling languages or model
transformations did perform best in real life applications (experience
report)? Can V&V support the whole software engineering process from
initial (informal) requirements via several model transformations to
source code?
In order to discuss these and further similar questions, we would like
to invite submissions related to the following topics:

   . V&V techniques for MDE activities, e.g. V&V for model2model or
model2text transformations
   . V&V at the level of the models: techniques for validating a model
or generating test cases from models, including simulation,
model-checking, model-based testing, etc.
   . V&V at the level of metamodels: techniques for validating
meta-models (languages) or for using meta-models to validate other
artefacts
   . The application of MDE to validation, testing and verification
   . Impact analysis of (meta-)model changes on validation. What is
the result of a change in a (meta-)model on the previous results of
validation?
   . V&V techniques supporting refinement, abstraction and structuring
   . The difficulties to apply V&V to MDE or vice versa? The gains?
   . Is there a domain of application where this approach is more convenient?
   . Case studies and experience reports
   . Tools and automation

As a final note, model transformations are increasingly becoming a
central tool in MDE, despite the fact that the study of their
properties is just beginning – as we realized during MoDeVVa 2009.
Thus, although the focus of MoDeVVa 2010 is the same as in previous
years, in this edition we particularly encourage submissions on model
transformations and associated validation and verification techniques.

** Submissions and Publication **

Submitted papers must not exceed 6 pages in the ACM format. The
proceedings of the workshop will be published in the AMC digital
library and the two best papers will be published in the Satellite
Event Proceedings (LNCS) of the MODELS conference.


** Workshop Format **

MoDeVVa 2010 will include paper presentations and discussions. We
anticipate an enjoyable and exciting event where all participants will
leave with answers or well-founded doubts ;) on MDE and V&V.


** Important Dates **

Submission : July 9, 2010
Notification to authors: August 23, 2010
Final version: September 17, 2010


** Program Committee **

Vasco Amaral (University Nova de Lisboa, Portugal)
Paul Ammann (George Mason University, USA)
Benoit Baudry (IRISA, France)
Fabrice Bouquet (University of Franche Comte, France)
Ruth Breu (Innsbruck University, Austria)
Gregor Engels (Universität Paderborn, Germany)
John Derrick (University of Sheffield, United Kingdom)
Alain Faivre (CEA LIST, France)
Mark Harman (King’s College London, United Kingdom)
Antti Huima (Conformiq, USA)
Levi Lúcio (University Nova de Lisboa, Portugal)
Eliane Martins (State University of Campinas, Brazil)
Mercedes Merayo (Universidad Complutense de Madrid, Spain)
Roman Nagy (BMW, Germany)
Alexander Pretschner (Fraunhofer IESE / TU Kaiserslautern, Germany)
Holger Schlingloff (Fraunhofer FIRST / HU Berlin, Germany)
Dehla Sokenou (GEBIT Solutions, Germany)
Yves Le Traon (University of Luxembourg, Luxembourg)
Elisangela Vieira (Alcatel Lucent, France)
Stephan Weißleder (Fraunhofer FIRST / HU Berlin, Germany)


** Organization Committee **

Levi Lúcio (University Nova de Lisboa, Portugal)
Elisangela Vieira (Alcatel Lucent, France)
Stephan Weißleder (Fraunhofer FIRST / HU Berlin, Germany)



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