[ecoop-info] Call for Fast Abstracts: TAIC PART 2010

Gordon Fraser fraser at cs.uni-saarland.de
Mon May 10 15:36:15 CEST 2010

CALL FOR FAST ABSTRACTS: Late breaking, PhD and Tools

Testing: Academic and Industrial Conference -
Practice and Research Techniques (TAIC PART 2010)

Windsor, United Kingdom
September 3 - 5, 2010


Theme and Goals:
TAIC PART is a conference that aims to forge collaboration between
industry and academia on the challenging and exciting problem of
software testing. It is sponsored by representatives of both industry
and academia, bringing together commercial and industrial software
developers and users with academic researchers working on the theory
and practice of software testing. The goals of TAIC PART range from
the articulation of fundamental research questions in the field of
software testing and analysis to practical challenges that are often
faced by software developers in industry.  TAIC PART is a unique event
that strives to combine the important aspects of a software testing
conference, workshop, and retreat.

Keynote Speakers:
Dr Wolfgang Grieskamp, Microsoft, USA
Prof Sir Tony Hoare, Microsoft Research Cambridge, UK
Prof Bertrand Meyer, ETH Zuerich, Switzerland

Call for Fast Abstracts:
We invite submission of fast abstracts with a limit of 4 pages:

- Late breaking results or work in progress will be evaluated
according to their ability to generate discussion and suggest
interesting areas for future research.

- PhD papers are for PhD students who are interested in receiving
feedback about dissertation research that is an early stage. There
will be a dedicated PhD session at the conference.

- Tool papers must focus on the design, implementation, and evaluation
of software testing and analysis tools and will be judged by the
technical merit, novelty, and evaluation of the tool. There will be a
tools session with the opportunity to demonstrate the tools.

TAIC PART 2010 solicits papers on, but is not limited to, the
following areas:

- Test Adequacy Criteria
- Test Suite Execution
- Test Coverage Monitoring
- Automated Test Data Generation
- Regression Testing
- Automated Debugging and Fault Localization
- Performance Evaluation
- Static and Dynamic Analysis
- Verification and Validation
- Software Reliability Engineering
- Model-Based Testing
- Testing and Formal Methods
- Testing and Model Checking
- Software Testing Process
- Technology Transfer

Authors should submit a PDF version of their paper through the TAIC
PART 2010 paper submission site. Papers must be written in English,
and prepared according to Springer's LNCS style (guidelines:
http://www.springer.de/comp/lncs/authors.html).  All papers will be
reviewed, and accepted papers will be published in a volume of the
Springer Lecture Notes in Computer Science series (LNCS).

Important Dates:
* Fast abstract submission: June 11, 2010
* Fast abstract notification: June 21, 2010

* Camera-ready version due: June 25, 2010
* Conference dates: September 3-5, 2010

Conference Chair:
Anthony Simons, Sheffield University, UK
Program Co-Chairs:
Leonardo Bottaci, University of Hull, UK
Gordon Fraser, Saarland University, Germany

Program Committee:
Rui Abreu, University of Porto, Portugal
Paul Baker,  Motorola, UK
Sigrid Eldh, Ericsson, Sweden
Michael Ernst, University of Washington, USA
Mark Harman, King's College, UK
Rob Hierons, Brunel University, UK
Daniel Hoffman, University of Victoria, Canada
John Hughes, QuviQ, Sweden
Gregory Kapfhammer, Allegheny College, USA
Wes Masri, American University of Beirut, Lebanon
Phil McMinn, Sheffield University, UK
Atif Memon, University of Maryland, USA
Manuel Nunez, Universidad Complutense de Madrid, Spain
Jeff Offutt, George Mason University, USA
Alexander Pretschner, Technische Universitaet Kaiserslautern, Germany
Filippo Ricca, Università degli Studi di Genova, Italy
Marc Roper, University of Strathclyde, Scotland
Paul Strooper, The University of Queensland, Australia
Nikolai Tillmann, Microsoft Research, USA
Timea Illes-Seifert, University of Heidelberg, Germany
Hasan Ural, University of Ottawa, Canada
Neil Walkinshaw, Sheffield University, UK
Elaine Weyuker, AT&T Research Labs, USA


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