[ecoop-info] Deadline extended --- ICST'14

Miroslav Velev mvelev at gmail.com
Fri Sep 20 09:23:29 CEST 2013


  Abstracts are still due on Sept 23, 2013

  Papers are now due on Oct 7, 2013

Call for Papers

Seventh IEEE International Conference on Software Testing, Verification,
and Validation (ICST’14)

Cleveland, Ohio, U.S.A., March 31 - April 4, 2014


Submission of abstracts:  September 23, 2013

Paper submission (EXTENDED):  October 7, 2013

The IEEE International Conference on Software Testing, Verification, and
Validation (ICST) is the premier conference for research in all areas
related to software testing. The ever-increasing complexity, ubiquity, and
dynamism of modern software systems is making software quality assurance
activities, and in particular software testing more challenging. ICST provides
an ideal forum where academics, industrial researchers, and practitioners
can present their latest approaches for ensuring the quality of today’s
complex software systems, exchange and discuss ideas, and compare
experiences. In this spirit, ICST welcomes both research papers that
present high quality original work and industry reports from practitioners
that present real world experiences from which others can benefit.

Topics of interest include, but are not limited to:

- Testing theory and practice

- Testing in globally-distributed organizations

- Model-based testing

- Domain specific testing, such as:

     = Web-service testing

     = Database testing

     = Embedded software testing

- Testing concurrent software

- Testing large-scale distribute systems

- Testing in multi-core environments

- Validation testing

- Security testing

- Quality assurance

- Model checking

- Testing metrics

- Fuzzing

- Inspections

- Testing tools

- Design for testability

- Testing education

- Technology transfer in testing

- Unit test-driven development

- Acceptance test-driven development and behavior driven development

- Testing of open source and third-party software

- Software reliability

- Performance and QoS testing

- Standards

- Formal verification

- Empirical studies of testing techniques

- Experience reports

Each submission will be reviewed by at least three members of the ICST Program
Committee. Authors of the best research papers presented at ICST 2014 will
be invited to extend their work for possible inclusion in a special issue
of Software Testing, Verification, and Reliability, a Wiley journal.



Research Track:

We invite submission of research and technical papers that describe
original and significant work in the research and practice of software
testing, verification and validation. Case studies and empirical research
are welcome. Papers must neither have been previously accepted for
publication nor submitted in another conference or journal. The ICST 2014
research track accepts only full research papers. Short papers are not
accepted to the research track.  Research papers must conform to the
two-column IEEE conference publication format (
http://www.computer.org/portal/web/cscps/formatting), must be submitted in
PDF format and must not exceed 10 pages (incl. references and appendix).

Industry Track:

There are two paper formats: full length (ten pages) and short (four
pages). Full length papers should present significant achievements and
advances in industrial software testing, verification, or validation.
Papers with metrics that quantify effects on time, cost, and quality are
preferred. Short papers should concentrate on experience reports or discuss
open problems or challenges. The program committee will review all
submission. Accepted and presented contributions will be part of the
published conference proceedings. The evaluation criteria for industry
papers are based less on the originality of the technical contribution, and
more on its relevance for practice soundness of the presented results, and
implications for research. Practitioners can alternatively submit to the
Industrial Presentations track that does not require a paper. Industry
papers must conform to the two-column IEEE conference publication format (
http://www.computer.org/portal/web/cscps/formatting), must be submitted in
pdf format and must not exceed 10 or 4 pages, respectively to full-length
papers or short papers (incl. references and appendix).

How to submit?


Submissions will be handled via EasyChair at

Important Dates


Submission of abstracts:  September 23, 2013

Paper submission:  September 30, 2013

Notification of acceptance:  December 22, 2013

Camera ready paper:  TBA

Conference date:  March 31 - April 4, 2014

Program Committee


Program Committee Chairs:

- Laurie Williams, North Carolina State University, USA

- Claes Wohlin, Blekinge Institute of Technology, Sweden

Committee Members:

- Paul Ammann, George Mason University, USA

- Anneliese Andrews, University of Denver, USA

- Giuliano Antoniol, Ecole Polytechnique de Montréal, Canada

- Thomas Ball, Microsoft Research, USA

- Fevzi Belli, University of Paderborn, Germany

- Tomas Berling, Saab AB, EDS, Sweden

- Kirill Bogdanov, University of Sheffield, UK

- Fabrice Bouquet, Université de Franche Comté, France

- Tevfik Bultan, University of California at Santa Barbara, USA

- Cristian Cadar, Imperial College London, UK

- Ana Cavalli, Institut National des Telecommunications, France

- James Clause, University of Delaware, USA

- Ian Craggs, IBM United Kingdom, UK

- Christoph Csallner, University of Texas at Arlington, USA

- Marcio Eduardo Delamaro, Universidade de São Paulo, Brazil

- Massimiliano Di Penta, University of Sannio, Italy

- Rachida Dssouli, Concordia University, Canada

- Lydie Du Bousquet, Laboratoire d'Informatique de Grenoble (LIG), France

- Stephen Edwards, Virginia Tech, USA

- Sigrid Eldh, Ericsson and Karlstad University, Sweden

- Robert Feldt, Blekinge Institute of Technology, Sweden

- Franck Fleurey, SINTEF, Norway

- Gordon Fraser, University of Sheffield, UK

- Sudipto Ghosh, Colorado State University, USA

- Arnaud Gotlieb, Simula Research Laboratory, Norway

- Jens Grabowski, Gottingen University, Germany

- Mark Harman, University College London, UK

- Robert Hierons, Brunel University, UK

- Florentin Ipate, University of Bucharest, Romania

- Natalia Juristo, Universidad Politécnica de Madrid, Spain

- Gail Kaiser, Columbia University, USA

- Aditya Kanade, Indian Institute of Science, India

- Johannes Kinder, École Polytechnique Fédérale de Lausanne (EPFL),

- Yu Lei, University of Texas at Arlington, USA

- Francesca Lonetti, ISTI CNR, Italy

- Eda Marchetti, ISTI-CNR, Italy

- Leonardo Mariani, University of Milan-Bicocca, Italy

- Darko Marinov, University of Illinois at Urbana-Champaign, USA

- Wes Masri, American University of Beirut, Lebanon

- Phil McMinn, University of Sheffield, UK

- Atif Memon, University of Maryland, USA

- James Miller, University of Alberta, Canada

- Tejeddine Mouelhi, University of Luxembourg, Luxembourg

- Henry Muccini, University of L'Aquila, Italy

- Jürgen Münch, University of Helsinki, Finland

- Nachiappan Nagappan, Microsoft Corporation, USA

- Brian Nielsen, Aalborg University, Denmark

- Jeff Offutt, George Mason University, USA

- Marcel Oliveira, Universidade Federal do Rio Grande do Norte, Brazil

- Thomas Ostrand, Rutgers University Center for Discrete Mathematics &
Computer Science, USA

- Alexander Pretschner, Technische Universitaet Muenchen, Germany

- Marc Roper, University of Strathclyde, UK

- Gregg Rothermel, University of Nebraska - Lincoln, USA

- Abhik Roychoudhury, National University of Singapore, Singapore

- Per Runeson, Lund University, Sweden

- Saurabh Sinha, IBM Research, India

- Paul Strooper, University of Queensland, Australia

- Lin Tan, University of Waterloo, Canada

- Tatsuhiro Tsuchiya, Osaka University, Japan

- Richard Torkar, Chalmers and the University of Gothenburg, Sweden

- Jan Tretmans, TNO - Embedded Systems Innovation, The Netherlands

- T.H. Tse, University of Hong Kong, Hong Kong

- Hasan Ural, University of Ottawa, Canada

- Arie van Deursen, Delft University of Technology, The Netherlands

- Miroslav Velev, Aries Design Automation, USA

- Helene Waeselynck, LAAS-CNRS, France

- Hironori Washizaki, Waseda University, Japan

- Michael Whalen, University of Minnesota, USA

- Franz Wotawa, Graz University of Technology, Austria

- Tao Xie, University of Illinois, USA

- Xiangyu Zhang, Purdue University, USA

- Hong Zhu, Oxford Brookes University, UK

- Peter Zimmerer, Siemens AG, Germany

- Thomas Zimmerman, Microsoft Research, USA
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