<!DOCTYPE HTML PUBLIC "-//W3C//DTD HTML 4.0 Transitional//EN">
<HTML><HEAD>
<META content="text/html; charset=iso-8859-1" http-equiv=Content-Type>
<META name=GENERATOR content="MSHTML 8.00.6001.18882">
<STYLE></STYLE>
</HEAD>
<BODY bgColor=#ffffff text=#000000>(Our apologies if you receive multiple copies
of this message)<FONT size=2 face=Arial></FONT>
<DIV><BR>INVITATION:</DIV>
<DIV><BR>=================<BR>Please consider to contribute to and/or forward to
the appropriate groups the following opportunity to submit and publish original
scientific results.<BR>=================<BR><BR>============== VALID 2010 | Call
for Papers ===============<BR><BR>CALL FOR PAPERS, TUTORIALS,
PANELS<BR><BR>VALID 2010: The Second International Conference on Advances in
System Testing and Validation Lifecycle<BR>August 22-27, 2010 - Nice,
France<BR><BR>General page: <A class=moz-txt-link-freetext
href="http://www.iaria.org/conferences2010/VALID10.html">http://www.iaria.org/conferences2010/VALID10.html</A><BR>Call
for Papers: <A class=moz-txt-link-freetext
href="http://www.iaria.org/conferences2010/CfPVALID10.html">http://www.iaria.org/conferences2010/CfPVALID10.html</A><BR><BR>Submission
deadline: March 20, 2010<BR><BR>Sponsored by IARIA, <A
class=moz-txt-link-abbreviated
href="http://www.iaria.org">www.iaria.org</A><BR>Extended versions of selected
papers will be published in IARIA Journals: <A class=moz-txt-link-freetext
href="http://www.iariajournals.org">http://www.iariajournals.org</A><BR>Publisher:
CPS ( see: <A class=moz-txt-link-freetext
href="http://www2.computer.org/portal/web/cscps">http://www2.computer.org/portal/web/cscps</A>
)<BR>Archived: IEEE CSDL (Computer Science Digital Library) and IEEE
Xplore<BR>Submitted for indexing: Elsevier's EI Compendex Database, EI's
Engineering Information Index<BR>Other indexes are being considered: INSPEC,
DBLP, Thomson Reuters Conference Proceedings Citation Index<BR><BR>Please note
the Poster Forum and Work in Progress options.<BR><BR>The topics suggested by
the conference can be discussed in term of concepts, state of the art, research,
standards, implementations, running experiments, applications, and industrial
case studies. Authors are invited to submit complete unpublished papers, which
are not under review in any other conference or journal in the following, but
not limited to, topic areas. <BR><BR>All tracks are open to both research and
industry contributions, in terms of Regular papers, Posters, Work in progress,
Technical/marketing/business presentations, Demos, Tutorials, and
Panels.<BR><BR>Before submission, please check and conform with the Editorial
rules: <A class=moz-txt-link-freetext
href="http://www.iaria.org/editorialrules.html">http://www.iaria.org/editorialrules.html</A><BR><BR>VALID
2010 Tracks (tracks' topics and submission details: see CfP on the
site)<BR><BR>Robust design methodologies<BR>Designing methodologies for robust
systems; Secure software techniques; Industrial real-time software; Defect
avoidance; Cost models for robust systems; Design for testability; Design for
reliability and variability; Design for adaptation and resilience; Design for
fault-tolerance and fast recovery; Design for manufacturability, yield and
reliability; Design for testability in the context of model-driven
engineering<BR><BR>Vulnerability discovery and resolution<BR>Vulnerability
assessment; On-line error detection; Vulnerabilities in hardware security;
Self-calibration; Alternative inspections; Non-intrusive vulnerability discovery
methods; Embedded malware detection<BR><BR>Defects and Debugging <BR>Debugging
techniques; Component debug; System debug; Software debug; Hardware debug;
System debug; Power-ground defects; Full-open defects in interconnecting lines;
Physical defects in memories and microprocessors; Zero-defect principles
<BR><BR>Diagnosis<BR>Diagnosis techniques; Advances in silicon debug and
diagnosis; Error diagnosis; History-based diagnosis; Multiple-defect diagnosis;
Optical diagnostics; Testability and diagnosability; Diagnosis and testing in mo
bile environments <BR><BR>System and feature testing <BR>Test strategy for
systems-in-package; Testing embedded systems; Testing high-speed systems;
Testing delay and performance; Testing communication traffic and QoS/SLA
metrics; Testing robustness; Software testing; Hardware testing; Supply-chain
testing; Memory testing; Microprocessor testing; Mixed-signal production test;
Testing multi-voltage domains; Interconnection and compatibility
testing<BR><BR>Testing techniques and mechanisms <BR>Fundamentals for digital
and analog testing; Emerging testing methodologies; Engineering test coverage;
Designing testing suites; Statistical testing; Functional testing; Parametric
testing; Defect- and data-driven testing; Automated testing; Embedded testing;
Autonomous self-testing; Low cost testing; Optimized testing; Testing systems
and devices; Test standards<BR><BR>Testing of wireless communications
systems<BR>Testing of mobile wireless communication systems; Testing of wireless
sensor networks; Testing of radio-frequency identification systems; Testing of
ad-hoc networks; Testing methods for emerging standards; Hardware-based
prototyping of wireless communication systems; Physical layer performance
verification; On-chip testing of wireless communication systems; Modeling and
simulation of wireless channels; Noise characterization and validation; Case
studies and industrial applications of test instruments;<BR><BR>Software
verification and validation<BR>High-speed interface verification and
fault-analysis; Software testing theory and practice; Model-based testing;
Verification metrics; Service/application specific testing; Model checking; OO
software testing; Testing embedded software; Quality assurance; Empirical
studies for verification and validation; Software inspection techniques;
Software testing tools; New approaches for software reliability verification and
validation<BR><BR>Testing and validation of run-time evolving systems
<BR>Automated testing for run-time evolving systems; Testing and validation of
evolving systems; Testing and validation of self-controlled systems; Testing
compile-time versus run-time dependency for evolving systems; On-line validation
and testing of evolving at run-time systems; Modeling for testability of
evolving at run-time systems; Near real-time and real-time monitoring of
run-time evolving systems; Verification and validation of reflective models for
testing; Verification and validation of fault tolerance in run-time evolving
systems <BR><BR>Feature-oriented testing<BR>Testing user interfaces and
user-driven features; Privacy testing; Ontology accuracy testing; Testing
semantic matching; Testing certification processes; Testing authentication
mechanisms; Testing biometrics methodologies and mechanisms; Testing
cross-nation systems; Testing system interoperability; Testing system safety;
Testing system robustness; Testing temporal constraints; Testing
transaction-based properties; Directed energy test capabilities /microwave,
laser, etc./; Testing delay and latency metrics<BR><BR>Domain-oriented
testing<BR>Testing autonomic and autonomous systems; Testing intrusion
prevention systems; Firewall testing; Information assurance testing; Testing
social network systems; Testing recommender systems; Testing biometric systems;
Testing diagnostic systems; Testing on-line systems; Testing financial systems;
Testing life threatening systems; Testing emergency systems; Testing
sensor-based systems; Testing testing systems <BR><BR><BR>==========<BR><B>VALID
Advisory Chairs</B><BR>Amirhossein Alimohammad, Ukalta Engineering/CTO, Canada
<BR>Andrea Baruzzo, Universitā degli Studi di Udine, Italy <BR>Lydie du
Bousquet, Laboratoire d'Informatique de Grenoble (LIG), France <BR>Petre Dini,
Concordia University, Canada / IARIA<BR>Henry Muccini, University of L'Aquila,
Italy <BR><B><BR>VALID 2010 Research Institute Liaison Chairs </B><BR>Alexander
Klaus, Fraunhofer Institute for Experimental Software Engineering (IESE),
Germany<BR>Juho Perälä, VTT Technical Research Centre of Finland, Finland
<BR><BR><B>VALID 2010 Industry/Research Liaison Chairs </B><BR>Davide Pandini,
STMicroelectronics - Agrate Brianza, Italy <BR>Juho Perälä, VTT Technical
Research Centre of Finland, Finland<BR>Raj Senguttuvan, Texas Instruments -
Dallas, USA<BR>Avik Sinha, IBM TJ Watson Research Center - Hawthorne,
USA<BR>Alin Stefanescu, SAP Research, Germany<BR>Bart Vermeulen, NXP
Semiconductors, The Netherlands<BR><BR><B>VALID 2010 Special Area
Chairs</B><BR><I>Testing of wireless communications
systems</I><BR> Amirhossein Alimohammad, Ukalta
Engineering/CTO, Canada<BR><I>Testing and validation of run-time evolving
systems</I><BR> Stefan van Baelen, KU Leuven
Belgium<BR> Hans-Gerhard Gross, Delft University of
Technology, The Netherlands<BR><BR>Committee members: <A
class=moz-txt-link-freetext
href="http://www.iaria.org/conferences2010/ComVALID10.html">http://www.iaria.org/conferences2010/ComVALID10.html</A><BR>====================<BR></DIV>
<DIV><FONT size=2 face=Arial></FONT> </DIV><br>
<FONT FACE=3D"Helvetica" SIZE=3D2>Disclaimer: <A HREF="http://www.kuleuven.be/cwis/email_disclaimer.htm">http://www.kuleuven.be/cwis/email_disclaimer.htm</A> for more information.</FONT>
<BR>
</BODY></HTML>