<html><body style="word-wrap: break-word; -webkit-nbsp-mode: space; -webkit-line-break: after-white-space; "> ICST 2013 - CALL FOR PAPERS<br>=====================================================================<br> 6th IEEE International Conference on Software Testing,<br> Verification, and Validation<br> (ICST 2013)<br><br> March 18-22, 2013, Luxembourg<br><br> <a href="http://www.icst.lu/">http://www.icst.lu/</a> <br>=====================================================================<br><br>NEW - MENTORING PROGRAM: Deadline July 3, 2012<br><br>---------------<br>Important Dates:<br>---------------<br><br>* Papers (research/industry tracks)<br> Paper submission: Sep. 17, 2012<br> Authors notification: Dec. 14, 2012<br> Camera-ready: Jan. 9, 2013<br><br>* Workshops<br> Submission of proposals: Sep. 29, 2012<br> Notification: Oct. 31, 2012<br><br>* Ph.D. Symposium<br> Paper submission: Nov. 14, 2012<br> Authors notification: Dec. 14, 2012<br><br>* Mentoring Program - NEW!<br> Paper submission: Jul. 3, 2012<br> Mentoring until sept. 7, 2012<br><br>* Testing Tools Track - NEW!<br> Submissions period: Sep. 17, 2012 - Dec. 4, 2012<br> On the fly selection<br><br>* Posters<br> Submission: Feb. 9, 2013<br> Authors notification: Feb. 23, 2013<br><br>* Dates of conference<br> Main conference: Mar. 19-21, 2013<br> Workshop days: Mar. 18 and 22, 2013<br><br>-----------<br>Submissions:<br>-----------<br><br>The IEEE International Conference on Software Testing, Verification, and<br>Validation (ICST) is the premier conference for research in all areas related to<br>software quality. The ever increasing complexity, ubiquity, and dynamism of<br>modern software systems is making software quality assurance activities, and in<br>particular software testing and analysis, more challenging. ICST provides an<br>ideal forum where academics, industrial researchers, and practitioners can<br>present their latest approaches for ensuring the quality of today's complex<br>software systems, exchange and discuss ideas, and compare experiences. In this<br>spirit, ICST welcomes both research papers that present high quality original<br>work and industry reports from practitioners that present real world experiences<br>from which others can benefit.<br><br>Each submission will be reviewed by at least three members of the ICST Program<br>Committee. Authors of the best papers presented at ICST 2013 will be invited to<br>extend their work for possible inclusion in a special issue of Software Testing,<br>Verification, and Reliability, a Wiley journal.<br><br>Topics of interest include, but are not limited to:<br>- Testing theory and practice<br>- Testing in globally-distributed organizations<br>- Model-based testing<br>- Model-driven development and testing<br>- Domain specific testing, such as:<br>- Security testing<br>- Web-service testing<br>- Database testing<br>- Embedded-software testing<br>- Testing concurrent software<br>- Testing large-scale distributed systems<br>- Testing in multi-core environments<br>- Validation testing<br>- Quality assurance<br>- Model checking<br>- Metrics and empirical studies<br>- Fuzzing<br>- Inspections<br>- Testing and analysis tools<br>- Design for testability<br>- Testing education<br>- Technology transfer in testing<br>- Agile/iterative/incremental testing processes<br>- Testing of open source and third-party software<br>- Software reliability<br>- Performance and QoS testing<br>- Standards<br>- Formal verification<br>- Experience reports<br><br>------------<br>Organization<br>------------<br><br>- General Chair<br>Yves Le Traon, University of Luxembourg, Luxembourg<br><br>- Program Chairs<br>Benoit Baudry, INRIA-Bretagne Atlantique, France<br>Alessandro Orso, Georgia Institute of Technology, USA<br><br>- Organizing Chair<br>Jacques Klein, University of Luxembourg, Luxembourg<br><br>- Workshop Chairs<br>Gordon Fraser, University of Sheffield, UK<br>Levi Lucio, McGill University, Canada<br><br>- Ph.D. Symposium Chairs<br>Jeff Offutt, George Mason University, USA<br>Hyunsook Do, North Dakota State University, USA<br><br>- Mentoring Program Chair<br>Per Runeson, Lund University, Sweden<br><br>- Testing Tools Track Chair<br>Manuel Oriol, ABB, Switzerland<br><br>- Poster Chairs<br>Roland Groz, LSR-IMAG, France<br>Tanja Vos, Universidad Politecnica de Valencia, Spain<br><br>- Publication Chair<br>Martin Monperrus, University of Lille, France<br><br>- Industrial Chair<br>Sigrid Eldh, Ericsson, Sweden<br><br>- Publicity Chairs<br>Eduardo Cunha de Almeida, Federal University of Parana, Brazil<br>Fabrice Bouquet, INRIA, France<br>Yue Jia, CREST, UK<br>James A. Jones, University of California Irvine, USA<br>Eda Marchetti, CNR, Italy<br>Mercedes G. Merayo, Universidad Complutense de Madrid, Spain<br>Gilles Perrouin, University of Namur, Belgium<br>Stephan Weissleder, Fraunhofer Institute, Germany<br>Ji Wu, Beihang University, China<br>Vipul Shah, Tata Consultancy Services, India<br><br>- Financial Chair<br>Laurent Betry, University of Luxembourg, Luxembourg<br><br>- Local Arrangements Chairs<br>Cecile Petit, University of Luxembourg, Luxembourg<br>Stephanie Annet, University of Luxembourg, Luxembourg<br>Ragnhildur Edda Eyjolfsdottir, University of Luxembourg, Luxembourg<br><br>- Webmasters<br>Phu Nguyen, University of Luxembourg, Luxembourg<br>Christopher Henard, University of Luxembourg, Luxembourg<br><br>- Steering Committee<br>Benoit Baudry, IRISA/INRIA, France<br>Antonia Bertolino, CNR, Italia<br>Lionel Briand, University of Luxembourg, Luxembourg<br>Ana Cavalli, Telecom&Management SudParis, France<br>Gordon Fraser, University of Sheffield, UK<br>Yvan Labiche, Carleton University, Canada<br>Atif Memon, University of Maryland, USA<br>Gregg Rothermel, University of Nebraska, USA<br>Ina Schieferdecker, Technical University Berlin, Germany<br><br>- Program Committee<br>Paul Ammann, George Mason University, USA<br>James Andrews, University of Western Ontario, Canada<br>Giuliano Antoniol, Ecole Polytechnique de Montreal, Canada<br>Paul Baker, Visa, UK<br>Thomas Ball, Microsoft Research, USA<br>Cristiano Bertolini, United Nations University, China<br>Antonia Bertolino, ISTI-CNR, Italy<br>Kirill Bogdanov, The University of Sheffield, UK<br>Fabrice Bouquet, University of Franche-Comte, France<br>Renee Bryce, Utah State University, USA<br>Tevfik Bultan, University of California Santa Barbara, USA<br>Cristian Cadar, Imperial College London, UK<br>Jeffrey Carver, University of Alabama, USA<br>Byoungju Choi, Ewha Womans University, Korea<br>James Clause, University of Delaware, USA<br>Myra Cohen, University of Nebraska-Lincoln, USA<br>Christoph Csallner, University of Texas at Arlington, USA<br>Massimiliano Di Penta, RCOST - University of Sannio, Italy<br>Lydie Du Bousquet, Universite' Joseph Fourier, France<br>Matt Dwyer, University of Nebraska-Lincoln, USA<br>Sigrid Eldh, Ericsson / Karlstad University, Sweden<br>Franck Fleurey, SINTEF, Norway<br>Phyllis Frankl, Polytechnic University, USA<br>Gordon Fraser, University of Sheffield, UK<br>Sudipto Ghosh, Colorado State University, USA<br>Arnaud Gotlieb, INRIA, France<br>Mark Grechanik, University of Illinois at Chicago, USA<br>William G.J. Halfond, University of Southern California, USA<br>Mark Harman, University College London, UK<br>Mary Jean Harrold, Georgia Institute of Technology, USA<br>Toru Hasegawa, KDDI R&D Laboratories, Inc.,Japan<br>Natalia Juristo, Universidad Politecnica de Madrid, Spain<br>Gail Kaiser, Columbia University, USA<br>Aditya Kanade, Indian Institute of Science, India<br>Gregory Kapfhammer, Allegheny College, USA<br>Sarfraz Khurshid, University of Texas at Austin, USA<br>Johannes Kinder, Ecole Polytechnique Federale de Lausanne, Switzerland<br>Pieter Kritzinger, University of Cape Town, South Africa<br>Bruno Legeard, Smartesting, France<br>Yu Lei, University of Texas at Arlington, USA<br>Jose' Carlos Maldonado, ICMC-USP, Brasil<br>Leonardo Mariani, Universita' di Milano Bicocca, Italy<br>Wes Masri, American University of Beirut, Lebanon<br>Phil Mcminn, University of Sheffield, UK<br>Ali Mesbah, University of British Columbia, Canada<br>Tejeddine Mouelhi, University of Luxembourg, Luxembourg<br>Henry Muccini, University of L'Aquila, Italy<br>Nachiappan Nagappan, Microsoft Research, USA<br>Brian Nielsen, Aalborg University, Denmark<br>Manuel Nunez, UCM, Spain<br>Jeff Offutt, George Mason University, USA<br>Mauro Pezze', University of Lugano, Switzerland<br>Lori Pollock, University of Delaware, USA<br>Alexander Pretschner, Karlsruhe Institute of Technology (KIT), Germany<br>Brian Robinson, ABB Inc. - US Corporate Research, USA<br>Abhik Roychoudhury, National University of Singapore, Singapore<br>Antonino Sabetta, SAP Research Sophia-Antipolis, France<br>Max Schaefer, IBM Research, USA<br>Saurabh Sinha, IBM Research - India, India<br>Paul Strooper, University of Queensland, Australia<br>Lin Tan, University of Waterloo, Canada<br>Nikolai Tillmann, Microsoft Research, USA<br>Paolo Tonella, Fondazione Bruno Kessler, Italy<br>Andreas Ulrich, Siemens AG, Germany<br>Willem Visser, Stellenbosch University, South Africa<br>Tanja Vos, Universidad Politecnica de Valencia, Spain<br>Stephan Weissleder, Fraunhofer Institute, Germany<br>Michael Whalen, University of Minnesota, USA<br>Laurie Williams, North Carolina State University, USA<br>Andreas Windisch, Technische Universitat Berlin, Germany<br>Claes Wohlin, Blekinge Institute of Technology, Sweden<br>Ji Wu, Beihang University, China<br>Michal Young, University of Oregon, USA<br>Andreas Zeller, Saarland University, Germany<br>Xiangyu Zhang, Purdue University, USA<br></body></html>