[ecoop-info] Deadlines approaching - CF CONTRIBUTIONS -ICST 2010 - Third International Conference on Software Testing, Verification and Validation

[Yves.letraon]

=========================
LAST CALL FOR CONTRIBUTIONS

Third International Conference on Software Testing, Verification and 
Validation (ICST 2010)
Sponsor: IEEE Computer Society Technical Committee on Software 
Engineering (TCSE), IEEE sponsorship pending

April 6-9 2010, Paris, France

Submission of abstracts: September 25, 2009
Submission of full papers: October 2, 2009


http://vps.it-sudparis.eu/icst2010/

Validation, testing, and verification activities are already flourishing 
areas with an active participation of a large community of researchers, 
experts, and industrials. This community is highly aware of the 
importance and impact of testing on the future deployment and use of 
software and software intensive systems. As illustrated during the two 
previous successful ICST editions, intensive research activities are 
being carried out in software testing, verification, and validation 
areas. Many new important issues and challenges are constantly being 
raised leading to new research and industrial projects. The IEEE 
International Conference on Software Testing Verification and Validation 
(ICST) is the premier conference in these areas. ICST welcomes research 
papers, as well as, industrial experience reports from software 
development and testing practitioners. Two tracks will be organised to 
select the accepted papers. For the research papers, we are looking for 
high quality papers presenting original work. Industrial papers should 
address practical software testing and quality improvement challenges 
and implementations, presenting empirical results or reporting on open 
problems/challenges. All papers should discuss broader implications and 
usage of the topics addressed.

Authors of best papers from the conference will be invited to revise and 
submit extended versions of their papers for a special issue of Software 
Testing, Verification, and Reliability, a Wiley journal.

For further details regarding the conference, please consult 
http://vps.it-sudparis.eu/icst2010/

Topics of interest include, but are not limited to:
• Software testing theory and practice
• Model-based testing
• Domain specific testing including, but not limited to, security 
testing, web services testing, database testing, and OO software testing
• Verification & validation
• Quality assurance
• Model checking
• Empirical studies
• Metrics
• Fuzzing testing
• Inspections
• Tools
• Testability and diagnosability
• Design for testability
• Testing education
• Testing in multidisciplinary applications
• Embedded software
• Technology transfer
• Model-Driven Engineering
• Novel approaches to software reliability assessment

Important dates

* Papers
Submission of abstracts: September 25, 2009
Submission of full papers: October 2, 2009
Notification: December 18, 2009
Camera-ready: January 10, 2010

* Ph. D. Symposium
Same deadlines as for papers

* Workshops
Submission of proposals: September 25, 2009
Notification: November 2, 2009


_________________________
General Chair
Marie-Claude Gaudel, Univ. Paris-Sud XI, France

Program Chairs
Ana Cavalli, Telecom & Management SudParis, France
Sudipto Ghosh, Colorado State University, USA

Workshop Chairs
Paul Ammann, George Mason University, USA
Benoit Baudry, IRISA, France
Ina Schieferdecker, Fraunhöfer Institute, Germany


Ph.D. Symposium Chairs
Atif Memon, University of Maryland, USA
Manuel Nuñez, Universidad Complutense de Madrid , Spain
Fatiha Zaidi, Univ. Paris-Sud XI , France

Industry Chairs
Paul Baker, Motorola, UK
Wolfgang Grieskamp, Microsoft Research, USA
Dominique Potier, System at tic, France
Andreas Ulrich, Siemens, Germany



For further details regarding the conference, please consult 
http://vps.it-sudparis.eu/icst2010/
=========================



-- 
________________________
Yves Le Traon
Professor
University of Luxembourg
LASSY team
Phone:     (+352) 46 66 44 5262

-------------- next part --------------
A non-text attachment was scrubbed...
Name: yves_letraon.vcf
Type: text/x-vcard
Size: 364 bytes
Desc: not available
Url : http://web.satd.uma.es/pipermail/ecoop-info/attachments/20090910/5e52bd40/attachment-0001.vcf