[ecoop-info] CFP: 13th Workshop on Advances in Model Based Testing (A-MOST'17) collocated with ICST'17, March 17th, 2017 in Tokyo, Japan

[Xavier Devroey]

The 13th Workshop on Advances in Model Based Testing (A-MOST’17) Co-located with IEEE International Conference on Software Testing, Verification and Validation (ICST’17) 

March 17th, 2017 in Tokyo, Japan

http://a-most17.zen-tools.com/

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Important Dates:
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Full and Short papers:
    Paper submission: December 11th, 2016
    Author notification: January 13th, 2017

Abstracts from already published papers:
    Submission:  February, 1st, 2017
    Notification: February, 10th,  2017
 
Conference date: March 17th, 2017 

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Topics of Interest
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The increasing complexity of software results in new challenges for testing. Model Based Testing (MBT) continues to be an important research area, where new approaches, methods and tools make MBT techniques more deployable and useful for industry than ever. A-MOST has proven to be a successful workshop that brings researchers and practitioners together discussing formal and semi-formal approaches, specification formats and notations that contribute to simplifying complex aspects of a system. The goal is to bring researchers and practitioners together to discuss state of the art, practice and future prospects in MBT.

Topics of Interest (not exhaustive): 
• The models used in MBT 
• The processes, techniques, and tools that support MBT 
• Evaluation (i.e., the evaluation of software using MBT and the evaluation of MBT) Models 
• Models for component, integration and system testing 
• Product-line models & (Hybrid) embedded system models 
• Systems-of-systems models & Architectural models 
• Models for orchestration and choreography of services 
• Executable models and simulation 
• Environment and use models 
• Non-functional models and quantitative MBT 
• Model-based test generation algorithms 
• Application of model checking techniques in model-based testing 
• Tracing from requirements model to test models 
• Performance and predictability of model-driven development 
• Test model evolution during the software lifecycle 
• Generation of testing-infrastructures from models 
• Combinatorial approaches for MBT Statistical testing 
• Estimating dependability (e.g., security, safety, reliability) using MBT 
• Coverage metrics and measurements for structural and (non-)functional models 
• Cost of testing, economic impact of MBT 
• Empirical validation, experiences, case studies using MBT 

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Full and short paper: 
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Papers should not exceed 10 pages (including all text, figures, references and appendices) for full papers or 6 pages for short experience and position papers. Each submitted paper must conform to the IEEE two-column publication format. Papers will be reviewed by at least three members from the program committee. Accepted papers will be published in the IEEE Digital Library.

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Abstracts from already published papers: 
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This year we also solicit abstracts from already published papers in relevant well known venues (conferences or journals). These will be selected based on the relevance, quality and importance of the paper. Selected abstracts will be presented and discussed in the workshop, similar to the regular papers, but will not be included in the proceedings. Though, their title and abstracts will be mentioned in the workshop summary.

Program Chairs: 
Paolo Arcaini, Charles University, Czech Republic
Xavier Devroey, University of Namur, Belgium
Shuai Wang, Simula Research Laboratory, Norway